Shielded Connectors For EMI, EMC Protection
Samtec is expanding its line of rugged, high-speed 0.80 mm pitch Edge Rate® interconnects. First is a mating set with both socket (ERF8 Series) and terminal (ERM8 Series) strips that are fully shielded. The shield encircles the entire mated connector system (a full 360ᵒ) to minimize the effects of EMI and EMC.
A 16 mm mated stack height will be released first, with 10 and 14 mm stacks to follow. The 12 mm stack with shielding is already released. These shielded systems are available initially in 20, 40, 50 and 60 positions, as well as vertical and edge mount orientations for parallel, right angle, and coplanar applications. Specify the -EGPS option for the shielded Edge Rate system.
Friction Locks Increase Mechanical Strength
Also, newly available is a friction latching option for the ERF8/ERM8 Series. These beryllium copper latches increase mechanical strength by two (2X), compared to systems without the latches. These latching systems are now available in a 10 mm stack height, with other sizes to follow. Specify the -L option for latching products.
Rugged, High Speed Contact
All of these products feature the rugged, high-speed Edge Rate contact, which allows the connectors to be zippered during un-mating. The smooth, milled surface of the Edge Rate contact reduces wear tracks on the contact, thus increasing the durability and cycle life of the contact system. The design of the Edge Rate contact minimizes parallel surface area, which reduces broadside coupling and crosstalk.
Samtec’s Edge Rate systems, including 0.50 mm pitch, are rated at 26 Gbps for high-speed performance in rugged applications. Additional features include standard solder tabs to increase the mechanical strength of the part on the board, optional extended guide posts and standard alignment pins for processing. The ERF8/ERM8 Series is E.L.P.™ (Extended Life Product™) certified for high mating cycles (250 to 2,500) and 10 year Mixed Flow Gas (MFG). E.L.P.™ products are tested to rigorous standards to evaluate contact resistance in simulated storage and field conditions.
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