Signal Integrity Journal Webinar Series 2018

Signal Integrity Journal, a sister publication to Microwave Journal, covers signal integrity, power integrity and EMC/EMI related topics with industry news, technical articles, white papers, products, Buyer’s Guide, webinars, videos and more. SI Journal is the only peer reviewed, industry journal covering these markets.

On February 28, 2018, Richard Mellitz (Distinguished Engineer, Samtec Signal Integrity Group), is presenting the following presentation as part of the Signal Integrity Journal Webinar Series:

“Effective Return Loss for 112G and 56G PAM 4”

Overview:

This presentation proposes using a pulse echo for time domain reflectometry (TDR) rather the commonly used step function echo.  The echoed pulse response of a single symbol is convolved with the modulation signal levels to produce an effective reflection coefficient metric at a specified bit error ratio (BER).  A conversion to dB results in an effective return loss (ERL) in more familiar return loss units. ERL is a single value which replaces the commonly used frequency domain return loss (RL) mask. It makes RL grading simple, straightforward and meaningful.

The webinar begins at 11:00 EST.  To learn more and to register,  visit the event website here.